求翻译: Applications of an infrared laser scan microscope in device testing 是什么意思?
语音:
参考翻译1: 红外激光的应用扫描在设备测试的显微镜 参考翻译2: 应用红外激光扫描显微镜在设备测试 参考翻译3: 红外激光扫描显微镜在设备检测中的应用程序 参考翻译4: 在设备测试中的红外激光扫描显微镜的应用 参考翻译5: 一种红外激光扫描显微镜在测试装置的应用
Equilibrium and disequilibrium stable isotope effects in modern charophyte calcites: implications for palaeoenvironmental studies的翻译是:平衡和失衡在现代charophyte calcites的稳定同位素作用:palaeoenvironmental研究的涵义[翻译]
A strategy to improve the contribution of coral data to high-resolution paleoclimatology的翻译是:A strategy to improve the contribution of coral data to high-resolution paleoclimatology[翻译]
Sea surface temperature variability in the North Atlantic during the last two glacial–interglacial cycles: comparison of faunal, oxygen isotopic, and Mg/Ca-derived records的翻译是:海表面温度可变性在最后两个冰河间冰期周期期间的北大西洋:同位素比较动物区系的氧气和Mg/Ca获得的纪录[翻译]
Trends in VLSI technologies的翻译是:趋向在VLSI技术[翻译]
Design verification and quality control of integrated circuits in an industrial environment的翻译是:设计集成电路证明和质量管理在一个产业环境里[翻译]
Chip verification of 4 Mbit DRAMs by E-Beam testing的翻译是:由E射线测试切削4个Mbit微量的证明[翻译]
Optical studies of electrostatic discharge phenomena in input/output structures的翻译是:静电释放现象的光学研究在输入-输出结构的[翻译]
High throughput E-B test system for VLSI memories的翻译是:VLSI记忆的高生产量E-B测试系统[翻译]
A new, fully integrated, E-beam tester的翻译是:新,充分地联合, E射线测试器[翻译]
Logic analyzer software for a multi-sampling E-beam prober的翻译是:多采样E射线探测器的逻辑分析器软件[翻译]
Applications of an infrared laser scan microscope in device testing的翻译是:红外激光的应用扫描在设备测试的显微镜[翻译]
High speed dynamic fault imaging的翻译是:高速动态缺点想象[翻译]
Application of immersion objective lens aberration properties for secondary electrons energy analysis的翻译是:油浸接物镜透镜二次电子能量分析的变型物产的应用[翻译]
A voltage contrast detector for electrical testing of multi-chip substrates的翻译是:A voltage contrast detector for electrical testing of multi-chip substrates[翻译]
A novel waveform measurement method for signals with low repetition rate的翻译是:信号的一个新颖的信号波形测量方法与低重复率[翻译]
Top down I.C. failure analysis using an E-beam system coupled to a functional tester的翻译是:冠上在I.C.失败分析下使用E射线系统被结合对一个功能测试器[翻译]
Timing diagram: A new electron-beam test technique for linking IC-internal measurements to simulation的翻译是:定时图表:连接集成电路内部测量的新的电子射线试验技术对模仿[翻译]
Single energy electron beam latch activation and desactivation的翻译是:[翻译]
High accuracy evaluation method for GaAs microwave integrated circuit characterization by frontside electro-optic probing的翻译是:GaAs微波集成电路描述特性的高精确度评估方法通过frontside电光探查[翻译]
A time-resolved optical beam induced current method的翻译是:一个定期解决的光学射线感应电流方法[翻译]

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