求翻译: Top down I.C. failure analysis using an E-beam system coupled to a functional tester 是什么意思?
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参考翻译1: 冠上在I.C.失败分析下使用E射线系统被结合对一个功能测试器 参考翻译2: 自顶向下内燃的失效分析使用电子束系统耦合到一个功能测试仪 参考翻译3: 自上而下的内燃机故障分析使用 E-梁系统耦合到功能测试仪 参考翻译4: 自上而下的。C。使用电子束系统耦合到功能测试仪的故障分析 参考翻译5: 自上而下的内燃机故障分析使用耦合到一个功能测试电子束系统
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Optical studies of electrostatic discharge phenomena in input/output structures的翻译是:静电释放现象的光学研究在输入-输出结构的[翻译]
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High speed dynamic fault imaging的翻译是:高速动态缺点想象[翻译]
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Top down I.C. failure analysis using an E-beam system coupled to a functional tester的翻译是:冠上在I.C.失败分析下使用E射线系统被结合对一个功能测试器[翻译]
Timing diagram: A new electron-beam test technique for linking IC-internal measurements to simulation的翻译是:定时图表:连接集成电路内部测量的新的电子射线试验技术对模仿[翻译]
Single energy electron beam latch activation and desactivation的翻译是:[翻译]
High accuracy evaluation method for GaAs microwave integrated circuit characterization by frontside electro-optic probing的翻译是:GaAs微波集成电路描述特性的高精确度评估方法通过frontside电光探查[翻译]
A time-resolved optical beam induced current method的翻译是:一个定期解决的光学射线感应电流方法[翻译]
Internal non contact testing method using ferroelectric liquid crystals的翻译是:使用铁电的液晶的内部非联络测试方法[翻译]
Electroluminescence measurements with temporal and spatial resolution for CMOS latch-up investigations的翻译是:Electroluminescence measurements with temporal and spatial resolution for CMOS latch-up investigations[翻译]
Simulation of single particle upsets in GaAs memories using focused electron beam pulses的翻译是:唯一微粒翻倒的模仿在使用被聚焦的电子束的GaAs记忆里搏动[翻译]
Scanning-DLTS investigation of point defect inhomogeneities in semiconducting materials的翻译是:在半导体的材料的点缺陷多相性的扫描DLTS调查[翻译]
SEM investigation of semiconductors by the capacitance techniques的翻译是:[翻译]

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